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Fashion Scout names Han Wen as winner of Merit Award

Lauretta Roberts
22 August 2016

New York label Han Wen has been revealed as the winner of this year’s Fashion Scout Merit Award which acts as a global launchpad for up and coming designers.

Designer Wen is a graduate of New York's Parsons School of Design and won the award ahead of hundreds of other applicants. Fashion Scout said his “attention to detail and combination of gold hardware, soft shell pink pleats and complex leather work turned the heads of this season’s selection panel”.

“Han Wen is a truly talented graduate of Parsons New York. His avant-garde collection is modern, edgy and extremely well made. Han Wen is a gifted designer who has great potential,” said Fashion Scout founder and creative director Martyn Roberts.

Wen will receive a fully sponsored catwalk show at London Fashion Week on 17 September at 5.30pm and will also receive a space in the Fashion Scout exhibition where he will be introduced to fashion buyers and press.

“I have always appreciated how the European fashion industry has always supported and encouraged up and coming designers. It is such an honour for me to receive this award, and I really can’t wait to present my creations to London and the world,” Wen said.

Merit Award alumni include Eudon Choi, Phoebe English, David Koma and Roberts|Wood.

Fashion Scout takes place from 16-20 September at Freemason’s Hall, London, WC2B.

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